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Semiconductor wafer probe card featuring a bent tungsten carbide test tip. The 1 μm gold-plated needle ensures high conductivity during integrated circuit testing. Built for precise wafer inspection tasks.
Not available in FR
Available in: DE
Product images
Available at Aliexpress.com
€ 82.69
| Color | Gold |
| Assembly Required | No |
| Foldable | No |
| Portable | No |
| Adjustable | No |
| Storage Compartments | No |
| Weather Resistant | No |
| Water Resistant | No |
| Easy Clean | No |
| Sustainable Materials | No |
| Bulb Included | No |
| Dimmable | No |
| Weather Protection Required | No |